A major acquisition will bring the first Aberration Corrected Transmission Electron Microscope to campus
The University of Florida’s Herbert Wertheim College of Engineering continues to distinguish itself as one of the top research facilities in the nation with the addition of three state-of-the-art, high-resolution electron microscopes.
“We’re incredibly excited to be a part of this partnership with the Research Services Center and Thermo Fisher Scientific,” said Department of Materials Science & Engineering (MSE) Chair Michele Manuel, Ph.D. “Other universities have similar equipment, but none can claim the latest, most complete suite of electron microscopes and most diverse materials characterization research instruments available – and all in one facility.”
The microscopes will be a part of UF’s Research Service Centers, which provide support and enhance the research, education and public service missions of the University of Florida by providing access to characterization and process instrumentation and facilities. With expert staff on hand to provide assistance and guidance, the students, faculty and industry researchers who use these facilities are ensured the most effective and appropriate use of the center’s capabilities.
All of the equipment is scheduled to be installed over the next few months, with final completion expected in Spring of 2020. Announcements on utilization, service and training will be sent to the UF research community upon achieving the installation milestones necessary to start accepting users.
For more information contact Luisa Amelia Dempere, Ph.D. at: email@example.com.
What’s Coming to UF?
The Helios G4 Plasma Focused Ion Beam CXe Workstation is a fourth generation, fully digital, Extreme High Resolution Field Emission Scanning Electron Microscope (FE SEM) equipped with an inductively coupled plasma (ICP) focused ion beam (PFIB).
The Talos F200i S/TEM is a flexible and compact 200 kV FEG Scanning Transmission Electron Microscope (S/TEM), which is designed for fast, precise and quantitative characterization of nanomaterials.
The 300 kV Themis Z is a FEG Scanning Transmission Electron Microscope (S/TEM) with a high-tension voltage range of 60-300 kV.