Tyler Lenzi received a B.S. in Materials Science Engineering from Washington State University (Pullman, Washington USA) in 1995 and finished his M.S. in Materials Science & Engineering from the University of Florida (Gainesville, Florida, USA) in 1997.

Mr. Lenzi has over 23 years of semiconductor manufacturing experience. He currently manages the Yield Enhancement, Data Science, Process Control, Corporate TEM Lab, and Wafer Level Testing teams for technology development at Micron Technology Inc. His technical expertise is in memory failure analysis that centers on the characterization, localization, and root cause analysis of failure mechanisms for next-generation memory devices. 

He has been a people leader for over 20 years and has been heavily involved in intern and full-time talent recruitment at Micron. He received a B.S. in Materials Science Engineering from Washington State University in 1995 and finished his M.S. in Materials Science & Engineering from the University of Florida in 1997. His thesis research work focused on the directional solidification of a Bi/2% Sn alloy under terrestrial conditions and manufactured the samples that went up in USMP-4 in 1997.