Last Updated:
October 25, 2000
Recent Presentations
Wide Energy Bandgap Based Semiconductor Gas Sensors
High Energy Proton Irradiation of MgO/GaN MOS Diodes
Requirements for Via Fabrication in High Density, 3-D GMR Devices
Nitride Based HBT Technology
Magnetic and Structural Characterization of Co, Cr, V Ion-Implanted GaN
GaN Gate-Controlled Diode
Synthesis and Characterization of GaMnN
Process Development for Small-area GaN/AlGaN HBT’s
Properties and Effects of Hydrogen in GaN
Advanced Plasma Processing of InGaAlN and SiC
Nitride Based HBT Technology
High-Density Plasma Etching of Silicon Carbide
Adapt University of Florida Mask Designs To MCNC Processes
Plasma Etching of GMR and CMR Materials
MURI Quad Chart 1
MURI Quad Chart 2
Tables
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